Selective growth by metal-organic chemical vapor deposition
(MOCVD), and electrochemical etching of a heavily Si-doped GaN (n+-GaN)
interlayer were employed to obtain air-gaps embedded in a u-GaN layer. As
confirmed by Raman spectroscopy, the introduction of an n+-GaN,
which was later etched to obtain air-gaps, also enhanced the strain-compliance
of GaN epilayer on sapphire substrate. An enhanced electroluminescence emission
was observed from the light-emitting diodes (LEDs) fabricated on the air-gap
embedding template. Using theoretical LED simulation, it was discerned that the
increase in optical emission from the LED was caused predominantly by the
redirection of photons at GaN/air-gap interface. Finite-difference time domain
(FDTD) simulation method was employed to understand the mechanism of optical
emission enhancement and its spatial variation over the LED surface.
Highlights
• Strain-relaxation in
GaN epilayer via insertion of a heavily Si-doped GaN interlayer.
• Three times increase in
electroluminescence (EL) intensity by the air-gaps formation.
• Enhanced indium
incorporation caused red-shifted EL peak of the air-gap LED.
Source:Current Applied
Physics
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